Technical Papers
The Embedded Path to Low DPM and Fast Silicon Bring-Up
September 2007
White Paper: Why Use ETSerdes™ to
Test High-Speed Serial I/Os?
July 2007
BIST Techniques for Delay and Jitter in Nanometer Technology ICs
May 2007
Memory Repair Primer: A Guide to Understanding Embedded Memory Repair
Options and Issues
April 2007
White Paper: ScanBurst™:
A Scan Infrastructure and Environment for Enhanced At-Speed ATPG
March 2007