Products Overview
The Dragonfly Test Platform™ delivers the industry’s most effective
combination of increased test quality, ease-of-adoption, test cost reductions,
and fast silicon bring-up time. Specifically targeted for 65nm and 45nm SoC
designs, Dragonfly fully-integrates LogicVision’s next generation BIST
solutions for manufacturing test, silicon bring-up and failure analysis.
ETCreate™ for Silicon Test
ETCreate family of products consists of embedded test IP and corresponding design automation software that enable high-quality, low-cost testing of ASIC and SoC designs.
Silicon Insight® for Silicon Diagnostics
Silicon Insight® family of products interact with LogicVision's embedded test IP and interface to external ATE or customer's performance board through a desktop PC to identify and analyze device failures and facilitate Device-Under-Test characterization. These products enable fast silicon bring-up and lower test costs through the support of interactive or test program controlled at-speed testing, data logging, and debug of silicon incorporating LogicVision's embedded test IP.
Yield Insight for Silicon Analysis
Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data, available from LogicVision's industry-leading embedded test products, to provide detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps and improve overall yields.
