ETMemory
LogicVision's ETMemory provides a complete solution for at-speed testing, diagnosis and repair of embedded memories, targeted specifically for nanometer scale designs. On-chip generated algorithmic test patterns are delivered to the memories at application clock frequencies.
To best address each customer's specific embedded memory test and yield needs, ETMemory consists of a base solution coupled with several major options, including key memory test and repair capabilities. The highest possible quality levels are possible at dense technology nodes through support for both hard and soft programmability that allows user defined algorithms to be either integrated into embedded test controllers at design time or downloaded into embedded test controllers at test time. Hard programmability achieves high quality levels with low area overhead, while soft programmability provides the ability to handle unforeseen defect mechanisms during production, enabling quality without costly re-spins.
To address growing embedded memory sizes and densities, and the resulting need for memory redundancy to ensure good memory yields, ETMemory provides fast on-chip memory repair analysis as well as on-chip memory self-repair.
ETMemory controllers are configurable to support a variety of memory types, as well as a range of memory timing interfaces and memory port configurations. Memory diagnostic options during debug and manufacturing test include a pass/fail flag, a serial interface for shifting out failure data, and a parallel interface for direct cycle by cycle comparisons. The ETMemory controllers are accessed and controlled through LogicVision's Test Access Port (TAP) interface hierarchy using IEEE 1149.1 and IEEE 1500 protocols. The controllers can be accessed throughout the life of the integrated circuit, including manufacturing test, silicon debug, and system verification phases.
ETMemory includes LogicVision's unique comprehensive automation suite that provides test rule checking, test planning, integration and verification all at the RT level. It also includes LogicVision's ETProduction capability which allows the encapsulation of fail datalog functionality into a dynamically linked library (DLL) that is linked directly into the user test program.
Available Advanced Product Options
ETMemory can be custom tailored to a customer's specific test and yield needs, offering multiple options to the robust base solution. Flexible options include post-silicon programmability, repair analysis and automated self-repair.
