Success Stories
With LogicVision's embedded test solution, IC designers embed test functionality into a semiconductor design that is used during semiconductor production and throughout the useful life of the chip.
LogicVision solutions enable faster and more powerful semiconductors, reduce overall time-to-market, lower overall manufacturing costs, and enable system level test and field diagnostics.
Specific solutions we have provided are highlighted below.
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"We carefully looked at available solutions in the market place and chose LogicVision's ETSerdes because it provides a purely digital, scaleable, RTL-based solution with sub-picosecond accuracy for testing our high speed I/Os with lane counts of up to 48. "ETSerdes allows us to run a comprehensive suite of tests and characterizations on existing automatic test equipment. Additionally, having the test functionality embedded in our devices allows us, and our end customers, to run tests and error injection in the host system environment for field-level debug and diagnostics."
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"With LogicVision’s embedded test, we had the Draco chip up and running within 45 minutes of receiving first silicon. "This is unprecedented within Broadcom for this complexity of a device. Broadcom sees the embedded test methodology as a key component for high quality at-speed test that also enables rapid bring up of first time silicon, even for the most complex of devices. "This combined with the diagnostic capabilities make embedded test essential in moving forward."
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"We have experienced great success in using LogicVision's embedded
test solutions for both memory and logic test. Not only are we
able to meet our stringent DPM (defects per million) requirements
to satisfy our customer needs, we were also able to realize fast
silicon bring-up times and achieve improved burn-in test quality.
Because of these results, we're expanding the use of LogicVision's
embedded logic and memory test solutions to other projects on a worldwide
basis."
Shinichi Iwamoto, |
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"We looked at the available 1149.6 solutions in the market and only
LogicVision provided the complete solution we needed. Using LogicVision's
solution we were able to deliver leading edge 1149.6 capability as
required by our customers on time and within specifications."
Rick O'Connor |
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"By using LogicVision's Silicon Insight product, PLX was able to easily characterize an embedded RAM in one of our latest devices. In addition to the advantages in cost and convenience of performing device diagnostics in the lab as opposed to on the production floor, we were able to complete the characterization of the RAM across multiple operating conditions and process corners within hours of the software installation."
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"The unique combination of LogicVision's Embedded Test technology and the Validator enables us to perform at-speed debug of our multi-million gate chips in days instead of weeks and pinpoint manufacturing yield hazards for rapid analysis and corrective action. We believe this fast, advanced debug capability will help us maintain a leading edge in the market by delivering robust, highly complex devices to our customers in a timely manner."
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“LogicVision’s Memory BIST solution
gives us the flexibility we need to effectively and efficiently
test the different embedded memories in next-generation Rapport
Kilocore Architecture devices. LogicVision offers a solution that
allows us to hierarchically group and test different types and
sizes of memories and allows us to select the best options for
testing each one. LogicVision also provides us with the tools to
easily integrate their BIST solutions into our design flow with
a minimum of effort.” |